“Vijay = GREAT marketer! I have worked with him for over 4 years. Vijay is details oriented, a team player and a visionary in our organization. Using his technical expertise and business acumen he has the ability to identify new high-value products. He also has fantastic communication skills that captivates our customers.”
About
Activity
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A good report from Jungle Scout on consumer trends in 2024 (https://lnkd.in/gv-TDCj9). The report highlights the increasing adoption of augmented…
A good report from Jungle Scout on consumer trends in 2024 (https://lnkd.in/gv-TDCj9). The report highlights the increasing adoption of augmented…
Liked by Vijay Ramani
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I am delighted to share that I will be taking the expanded role of leading a multidisciplinary Design team for Monetization @ Meta. The Monetization…
I am delighted to share that I will be taking the expanded role of leading a multidisciplinary Design team for Monetization @ Meta. The Monetization…
Liked by Vijay Ramani
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I’m thrilled to announce my new role as the Vice President of Amazon Business; our Global B2B store and one of the fastest growing ventures in…
I’m thrilled to announce my new role as the Vice President of Amazon Business; our Global B2B store and one of the fastest growing ventures in…
Liked by Vijay Ramani
Experience & Education
Patents
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Methods and systems for inspection of a wafer or setting up an inspection process
Issued USPTO 07659975
Methods and systems for inspection of a wafer or setting up an inspection process are provided. One method for inspection of a wafer includes detecting first and second sets of defects on the wafer by performing different scans of the wafer with different focus offsets. The method also includes comparing results of the different scans for a defect of the first set and a defect of the second set that are detected at approximately the same location on the wafer. The method further includes…
Methods and systems for inspection of a wafer or setting up an inspection process are provided. One method for inspection of a wafer includes detecting first and second sets of defects on the wafer by performing different scans of the wafer with different focus offsets. The method also includes comparing results of the different scans for a defect of the first set and a defect of the second set that are detected at approximately the same location on the wafer. The method further includes determining if the defect of the first and second sets is a defect of an underlying layer or an uppermost layer formed on the wafer based on results of the comparing step.
Languages
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English
Native or bilingual proficiency
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Korean
Elementary proficiency
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Mandarin
Elementary proficiency
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Hindi
Professional working proficiency
Recommendations received
4 people have recommended Vijay
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Amazon is revolutionizing the way people shop with cutting-edge AI features! Here are some highlights: View in your room, Virtual Try-On: Use…
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