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Showing 1–1 of 1 results for author: Nkuba, C K

  1. L2Fuzz: Discovering Bluetooth L2CAP Vulnerabilities Using Stateful Fuzz Testing

    Authors: Haram Park, Carlos Kayembe Nkuba, Seunghoon Woo, Heejo Lee

    Abstract: Bluetooth Basic Rate/Enhanced Data Rate (BR/EDR) is a wireless technology used in billions of devices. Recently, several Bluetooth fuzzing studies have been conducted to detect vulnerabilities in Bluetooth devices, but they fall short of effectively generating malformed packets. In this paper, we propose L2FUZZ, a stateful fuzzer to detect vulnerabilities in Bluetooth BR/EDR Logical Link Control a… ▽ More

    Submitted 29 July, 2022; originally announced August 2022.

    Comments: Updated version (2022.07.30)

    Journal ref: 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)